RESEARCH - 경희대 김영동 교수님 연구실

Ellipsometry · measures the change in polarization state of light reflected from the surface of a sample. The measured values are expressed as psi and delta. These values are related to the ratio of Fresnel reflection coefficients, Rp and Rs for p- and s- polarized light, respectively. Because ellipsometry measures the ratio ...

Spectroscopic ellipsometry of graphene and an exciton-shifted van Hove peak in a

The aim of this work is to elucidate optical properties of graphene layers in visible light using variable angle spectroscopic ellipsometry and large (typical size of 100μm) high quality...

Variable Angle Spectroscopic Ellipsometry (VASE) for the Study of Ion-Beam and G

In the most commonly used form of ellipsometry, a... automated spectroscopic ellipsometer used at the University of Nebraska. The angle of incidence can be set over a wide range...

Crystals | Free Full-Text | Variable Angle Spectroscopic Ellipsometry Characteri

settings Order Article Reprints Variable Angle Spectroscopic Ellipsometry Characterization of Graphene Oxide in Methanol Films 1 Department of Physics, University of Calabria, 87036 Rende...

Applications of Variable-Angle Spectroscopic Ellipsometry to Strained SiGe Alloy

Variable angle spectroscopic ellipsometry (VASE) has been used to characterize several SixGel-x/Ge heterostructures. First, SixGel-x/ Ge superlattice (SL) structures were characterized in terms of...

Microstructural Analysis and Modelling of Thin Porous Silicon Layers with Variab

Variable angle spectroscopic ellipsometry was used for characterization in the spectral range 1.24–5.00 eV. Four multilayer models were developed for the PS layers. Ellipsometric spectra...

A spectroscopic ellipsometry study of TiO2 thin films prepared by ion-assisted electron-beam evaporation

Film characterization based on variable-angle spectroscopic ellipsometry (VASE) is desirable in order to understand physical and optical characteristics of thin films. A number of TiO2 film...

refellips - Ellipsometry data analysis in Python — refellips documentation

refellips - Ellipsometry data analysis in Python refellips is a Python package designed for the analysis of variable angle spectroscopic ellipsometry (VASE) data. It is a flexible package...

Coatings | Free Full-Text | Variable Angle Spectroscopic Ellipsometry Characteri

Variable Angle Spectroscopic Ellipsometry Characterization of DMOAP-Functionalized Graphene Oxide Films 1 Department of Information Engineering, Infrastructures and Sustainable Energy...

Variable Angle Spectroscopic Ellipsometry Studies of HgI2 | MRS Online Proceedin

Variable angle spectroscopic ellipsometry (VASE) measurements were employed to study the optical properties of HgI 2 . The bulk crystal HgI 2 surface was subjected to a 10% KI etching prior...